Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability
Tarek Mohamed; Victor M. van Santen; Lilas Alrahis; Ozgur Sinanoglu; Hussam Amrouch
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Circuits and Systems I: Regular Papers
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tcsi.2024.3397460
The original publisher provides the full text and its access options.
Cite this source
Tarek Mohamed; Victor M. van Santen; Lilas Alrahis; Ozgur Sinanoglu; Hussam Amrouch. Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability. IEEE Transactions on Circuits and Systems I: Regular Papers. 2024-07. https://doi.org/10.1109/tcsi.2024.3397460