Design and reliability assessment of an ultra-thin body electrostatically doped bipolar transistor for mixed signal applications
Abhishek Sahu; Abhishek Kumar; Anurag Dwivedi; Shree Prakash Tiwari
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Memories - Materials, Devices, Circuits and Systems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.memori.2024.100108
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Cite this source
Abhishek Sahu; Abhishek Kumar; Anurag Dwivedi; Shree Prakash Tiwari. Design and reliability assessment of an ultra-thin body electrostatically doped bipolar transistor for mixed signal applications. Memories - Materials, Devices, Circuits and Systems. 2024-08. https://doi.org/10.1016/j.memori.2024.100108