Lot Quality Prediction in Semiconductor Manufacturing Final Test Using Multilayer Perceptron
Ranzel V. Dimaculangan; Robert G. De Luna
- Published
- Publisher
- IEEE
- Journal / collection
- TENCON 2024 - 2024 IEEE Region 10 Conference (TENCON)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/tencon61640.2024.10903083
The original publisher provides the full text and its access options.
Cite this source
Ranzel V. Dimaculangan; Robert G. De Luna. Lot Quality Prediction in Semiconductor Manufacturing Final Test Using Multilayer Perceptron. TENCON 2024 - 2024 IEEE Region 10 Conference (TENCON). 2024-12-01. https://doi.org/10.1109/tencon61640.2024.10903083