Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

An AI-Enabled Framework for Smart Semiconductor Manufacturing

Khaled Sidahmed Sidahmed Alamin; Davide Appello; Alessandro Beghi; Nicola Dall'Ora; Fabio Depaoli; Santa Di Cataldo; Franco Fummi; Sebastiano Gaiardelli; Michele Lora; Enrico Macii; Alessio Mascolini; Daniele Pagano; Francesco Ponzio; Gian Antonio Susto; Sara Vinco

Published
Publisher
IEEE
Journal / collection
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Research area
Semiconductors
Source type
Conference paper
DOI
10.23919/date58400.2024.10546768

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Khaled Sidahmed Sidahmed Alamin; Davide Appello; Alessandro Beghi; Nicola Dall'Ora; Fabio Depaoli; Santa Di Cataldo; Franco Fummi; Sebastiano Gaiardelli; Michele Lora; Enrico Macii; Alessio Mascolini; Daniele Pagano; Francesco Ponzio; Gian Antonio Susto; Sara Vinco. An AI-Enabled Framework for Smart Semiconductor Manufacturing. 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE). 2024-03-25. https://doi.org/10.23919/date58400.2024.10546768

Download RIS