Investigation of Semiconductor Die Area as a Reference Variable for LCA
Marina Proske; Mathilde Billaud; Christian Clemm; David Sanchez; Yannick Lorf; Lutz Stobbe
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 Electronics Goes Green 2024+ (EGG)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.23919/egg62010.2024.10631237
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Cite this source
Marina Proske; Mathilde Billaud; Christian Clemm; David Sanchez; Yannick Lorf; Lutz Stobbe. Investigation of Semiconductor Die Area as a Reference Variable for LCA. 2024 Electronics Goes Green 2024+ (EGG). 2024-06-18. https://doi.org/10.23919/egg62010.2024.10631237