Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies
Michael Kögel; Sebastian Brand; Frank Altmann
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2024tpv1
The original publisher provides the full text and its access options.
Cite this source
Michael Kögel; Sebastian Brand; Frank Altmann. Machine Learning in Semiconductor Failure Analysis: Techniques and Case Studies. International Symposium for Testing and Failure Analysis. 2024-10-28. https://doi.org/10.31399/asm.cp.istfa2024tpv1