A Comparative Study of Material Impact on Tunnel Field-Effect Transistor (TFET) Performance
Manish Verma; Pradipta Dutta; Arindam Basak; Ramesh Kumar
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Conference on Emerging Trends in Networks and Computer Communications (ETNCC)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/etncc63262.2024.10767569
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Cite this source
Manish Verma; Pradipta Dutta; Arindam Basak; Ramesh Kumar. A Comparative Study of Material Impact on Tunnel Field-Effect Transistor (TFET) Performance. 2024 International Conference on Emerging Trends in Networks and Computer Communications (ETNCC). 2024-07-23. https://doi.org/10.1109/etncc63262.2024.10767569