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Research literature / Conference paper

Unveiling the Impact of AC PBTI on Hydrogen Formation in Oxide Semiconductor Transistors

Gan Liu; Qiwen Kong; Zuopu Zhou; X. Ying; Chen Sun; Kaizhen Han; Yuye Kang; Dong Zhang; Xiaolin Wang; Yang Feng; Wei Shi; Bich-Yen Nguyen; N. Kai; Gengchiau Liang; Xiao Gong

Published
Publisher
IEEE
Journal / collection
2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/vlsitechnologyandcir46783.2024.10631389

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Gan Liu; Qiwen Kong; Zuopu Zhou; X. Ying; Chen Sun; Kaizhen Han; Yuye Kang; Dong Zhang; Xiaolin Wang; Yang Feng; Wei Shi; Bich-Yen Nguyen; N. Kai; Gengchiau Liang; Xiao Gong. Unveiling the Impact of AC PBTI on Hydrogen Formation in Oxide Semiconductor Transistors. 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits). 2024-06-16. https://doi.org/10.1109/vlsitechnologyandcir46783.2024.10631389

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