Cascode GaN Power Transistor Robust for Single Event Burnout Caused by Neutron Irradiation
Ken Shono; Yoshiyuki Kotani; Ronald Barr; Likun Shen; Steven Wienecke
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/irps48204.2025.10983763
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Cite this source
Ken Shono; Yoshiyuki Kotani; Ronald Barr; Likun Shen; Steven Wienecke. Cascode GaN Power Transistor Robust for Single Event Burnout Caused by Neutron Irradiation. 2025 IEEE International Reliability Physics Symposium (IRPS). 2025-03-30. https://doi.org/10.1109/irps48204.2025.10983763