RLCkt II: Deep Reinforcement Learning via Attention-Aware Sampling for Analog Integrated Circuit Transistor Sizing Automation
Wangge Zuo; WenZhao Sun; Bijian Lan; Jing Wan
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 2nd International Symposium of Electronics Design Automation (ISEDA)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iseda62518.2024.10617708
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Cite this source
Wangge Zuo; WenZhao Sun; Bijian Lan; Jing Wan. RLCkt II: Deep Reinforcement Learning via Attention-Aware Sampling for Analog Integrated Circuit Transistor Sizing Automation. 2024 2nd International Symposium of Electronics Design Automation (ISEDA). 2024-05-10. https://doi.org/10.1109/iseda62518.2024.10617708