Detection of Thiocholine for Pesticide Qualification Using Indium-Tin-Oxide-Coated Vertically Aligned Silicon Nanowires Extended Gate Field-Effect Transistor
Yu-Ting Wei; Yu-Chan Chao; Shu-Ping Lin
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Meeting Abstracts
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/ma2024-01331629mtgabs
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Cite this source
Yu-Ting Wei; Yu-Chan Chao; Shu-Ping Lin. Detection of Thiocholine for Pesticide Qualification Using Indium-Tin-Oxide-Coated Vertically Aligned Silicon Nanowires Extended Gate Field-Effect Transistor. ECS Meeting Abstracts. 2024-08-09. https://doi.org/10.1149/ma2024-01331629mtgabs