Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Preprint / posted paper

Accurate ON-State Resistance Extraction for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions

Mohsen Asoodar; Mehrdad Nahalparvari; Simon Schneider; Iman Shafikhani; Gunnar Ingeström; Hans-Peter Nee

Published
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.36227/techrxiv.170492157.73343752/v1

Read the original source ↗

This is a preprint or other posted paper. Check the original source for its review and publication status.

The original publisher provides the full text and its access options.

Cite this source

Mohsen Asoodar; Mehrdad Nahalparvari; Simon Schneider; Iman Shafikhani; Gunnar Ingeström; Hans-Peter Nee. Accurate ON-State Resistance Extraction for Online Condition Monitoring of Semiconductor Devices Under Noisy Conditions. Institute of Electrical and Electronics Engineers (IEEE). 2024-01-10. https://doi.org/10.36227/techrxiv.170492157.73343752/v1

Download RIS