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Research literature / Conference paper

Self-Heating Induced Reliability Issues and Revealing Early Ageing in Thin PDSOI Transistor

Amit Kumar; Shashank Banchhor; Pradyum Pal; Narendra Pratap; Shubham Kumar; Ashutosh Yadav; Sudeb Dasgupta; Anand Bulusu; Nitanshu Chauhan

Published
Publisher
IEEE
Journal / collection
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/edtm58488.2024.10511721

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Amit Kumar; Shashank Banchhor; Pradyum Pal; Narendra Pratap; Shubham Kumar; Ashutosh Yadav; Sudeb Dasgupta; Anand Bulusu; Nitanshu Chauhan. Self-Heating Induced Reliability Issues and Revealing Early Ageing in Thin PDSOI Transistor. 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). 2024-03-03. https://doi.org/10.1109/edtm58488.2024.10511721

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