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Research literature / Conference paper

Single electron charge detection in nanoscale metal double-dot: DC Single Electron Transistor vs gate RF sensing

Mohammad Istiaque Rahaman; Gergo P. Szakmany; Xavier Jehl; Alexei O. Orlov; Gregory L. Snider

Published
Publisher
IEEE
Journal / collection
2024 IEEE Silicon Nanoelectronics Workshop (SNW)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/snw63608.2024.10639222

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Mohammad Istiaque Rahaman; Gergo P. Szakmany; Xavier Jehl; Alexei O. Orlov; Gregory L. Snider. Single electron charge detection in nanoscale metal double-dot: DC Single Electron Transistor vs gate RF sensing. 2024 IEEE Silicon Nanoelectronics Workshop (SNW). 2024-06-15. https://doi.org/10.1109/snw63608.2024.10639222

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