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Research literature / Conference paper

Wide-Field Quantum Diamond Magnetic Microscopy at Nanotesla Sensitivity for Non-Destructive Semiconductor Failure Analysis

Samuel Mondberg; Luis D. Bonavena; Teresa K. Pfau; Bjarne Schümann; Alexander Huck; Ulrik L. Andersen; Christian D. Nielsen; Marvin Holten; Gilbert Rikkink; Thijs Kempers

Published
Publisher
ASM International
Journal / collection
International Symposium for Testing and Failure Analysis
Research area
Semiconductors
Source type
Conference paper
DOI
10.31399/asm.cp.istfa2026p0446

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Samuel Mondberg; Luis D. Bonavena; Teresa K. Pfau; Bjarne Schümann; Alexander Huck; Ulrik L. Andersen; Christian D. Nielsen; Marvin Holten; Gilbert Rikkink; Thijs Kempers. Wide-Field Quantum Diamond Magnetic Microscopy at Nanotesla Sensitivity for Non-Destructive Semiconductor Failure Analysis. International Symposium for Testing and Failure Analysis. 2026-10-04. https://doi.org/10.31399/asm.cp.istfa2026p0446

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