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Research literature / Conference paper

STEM EBIC Imaging of Silicon and GaN-Based Transistors

William A. Hubbard

Published
Publisher
ASM International
Journal / collection
International Symposium for Testing and Failure Analysis
Research area
Semiconductors
Source type
Conference paper
DOI
10.31399/asm.cp.istfa2026tp00k1

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William A. Hubbard. STEM EBIC Imaging of Silicon and GaN-Based Transistors. International Symposium for Testing and Failure Analysis. 2026-10-04. https://doi.org/10.31399/asm.cp.istfa2026tp00k1

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