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Research literature / Conference paper

Parameter Interdependencies in Knowledge Graphs for Manufacturing Processes

Tom Jeleniewski; Jonathan Reif; Felix Gehlhoff; Alexander Fay

Published
Publisher
IEEE
Journal / collection
2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA)
Research area
Industrial systems
Source type
Conference paper
DOI
10.1109/etfa61755.2024.10711066

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Tom Jeleniewski; Jonathan Reif; Felix Gehlhoff; Alexander Fay. Parameter Interdependencies in Knowledge Graphs for Manufacturing Processes. 2024 IEEE 29th International Conference on Emerging Technologies and Factory Automation (ETFA). 2024-09-10. https://doi.org/10.1109/etfa61755.2024.10711066

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