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Research literature / Conference paper

Development of a Leakage Current Measurement System for Semiconductor Detectors

Bowen Yang; Chuahao Hu; Guoqiang Zeng; Dan Li; Honglin Zhao; Haotian Li

Published
Publisher
IEEE
Journal / collection
2024 Academic Conference of China Instrument and Control Society (ACCIS)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/accis62068.2024.10948613

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Bowen Yang; Chuahao Hu; Guoqiang Zeng; Dan Li; Honglin Zhao; Haotian Li. Development of a Leakage Current Measurement System for Semiconductor Detectors. 2024 Academic Conference of China Instrument and Control Society (ACCIS). 2024-07-28. https://doi.org/10.1109/accis62068.2024.10948613

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