A Failure Analysis Framework for Ferroelectric Field-Effect Transistor Memory
Jianze Wang; Wei Zhang; Xuanyao Fong
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Conference on IC Design and Technology (ICICDT)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icicdt63592.2024.10717796
The original publisher provides the full text and its access options.
Cite this source
Jianze Wang; Wei Zhang; Xuanyao Fong. A Failure Analysis Framework for Ferroelectric Field-Effect Transistor Memory. 2024 IEEE International Conference on IC Design and Technology (ICICDT). 2024-09-25. https://doi.org/10.1109/icicdt63592.2024.10717796