Applying Large Language Model to User Experience Testing
Nien-Lin Hsueh; Hsuen-Jen Lin; Lien-Chi Lai
- Published
- Publisher
- MDPI AG
- Journal / collection
- Electronics
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.3390/electronics13234633
The original publisher provides the full text and its access options.
Cite this source
Nien-Lin Hsueh; Hsuen-Jen Lin; Lien-Chi Lai. Applying Large Language Model to User Experience Testing. Electronics. 2024-11-24. https://doi.org/10.3390/electronics13234633