Analysis of Channel Current Noise in Small Nanoscale Metal Oxide Semiconductor Field Effect Transistors
Xiaofei Jia; Qun Wei; Yan Zhu; Wenpeng Zhang; Liang He
- Published
- Publisher
- Wiley
- Journal / collection
- Small
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/smll.202403659
The original publisher provides the full text and its access options.
Cite this source
Xiaofei Jia; Qun Wei; Yan Zhu; Wenpeng Zhang; Liang He. Analysis of Channel Current Noise in Small Nanoscale Metal Oxide Semiconductor Field Effect Transistors. Small. 2024-08-21. https://doi.org/10.1002/smll.202403659