Hybrid-Free DNA Test by Band Engineering of Nitride Semiconductor and Machine Learning
Thi Anh Nguyet Nguyen; Fan-Ching Chien; Thuy Doan Khanh Huynh; Huy Kim Nhat; Yu-Chi Chiu; Hao-Tsung Yang; Chen-Yi Yu; Chih-Ming Wang; Jian-Zong Lai; Duy Thanh Cu; Chien Cheng Kuo; Kun-Yu Lai
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- ACS Applied Electronic Materials
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1021/acsaelm.4c02220
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Cite this source
Thi Anh Nguyet Nguyen; Fan-Ching Chien; Thuy Doan Khanh Huynh; Huy Kim Nhat; Yu-Chi Chiu; Hao-Tsung Yang; Chen-Yi Yu; Chih-Ming Wang; Jian-Zong Lai; Duy Thanh Cu; Chien Cheng Kuo; Kun-Yu Lai. Hybrid-Free DNA Test by Band Engineering of Nitride Semiconductor and Machine Learning. ACS Applied Electronic Materials. 2025-04-07. https://doi.org/10.1021/acsaelm.4c02220