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Research literature / Conference paper

High resolution and metrologically traceable characterization of semiconductor lasers at SWIR wavelength with InGaAs sensors

Amir Sharghi; Carles Monasterio Balcells; Thomas Limmer

Published
Publisher
SPIE
Journal / collection
Semiconductor Lasers and Laser Dynamics XI
Research area
Semiconductors
Source type
Conference paper
DOI
10.1117/12.3017544

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Amir Sharghi; Carles Monasterio Balcells; Thomas Limmer. High resolution and metrologically traceable characterization of semiconductor lasers at SWIR wavelength with InGaAs sensors. Semiconductor Lasers and Laser Dynamics XI. 2024-06-20. https://doi.org/10.1117/12.3017544

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