AUTOMATED INFORMATION-MEASURING SYSTEM FOR MEASUREMENT OF VOLTAGE CHARACTERISTICS OF SEMICONDUCTOR STRUCTURES
Penza State University; Ekaterina A. Pecherskaya; Oleg V. Karpanin; Penza State University; Diana E. Tuzova; Penza State University; Mikhail A. Nelyutskov; Penza State University; Aleksandr A. Danilov; The State Regional Center for Standardization, Metrology and Testing; Dmitry V. Artamonov; Penza State University
- Published
- Publisher
- Penza State University
- Journal / collection
- Measuring. Monitoring. Management. Control
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.21685/2307-5538-2024-3-5
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Cite this source
Penza State University; Ekaterina A. Pecherskaya; Oleg V. Karpanin; Penza State University; Diana E. Tuzova; Penza State University; Mikhail A. Nelyutskov; Penza State University; Aleksandr A. Danilov; The State Regional Center for Standardization, Metrology and Testing; Dmitry V. Artamonov; Penza State University. AUTOMATED INFORMATION-MEASURING SYSTEM FOR MEASUREMENT OF VOLTAGE CHARACTERISTICS OF SEMICONDUCTOR STRUCTURES. Measuring. Monitoring. Management. Control. 2024. https://doi.org/10.21685/2307-5538-2024-3-5