Electric Fields at Semiconductor Interfaces by momentum-resolved 4D STEM: towards Correlation with Device Characteristics
Kerstin Volz
- Published
- Publisher
- ScienceOpen
- Journal / collection
- Electric Fields at Semiconductor Interfaces by momentum-resolved 4D STEM: towards Correlation with Device Characteristics
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.14293/apmc13-2025-0051
The original publisher provides the full text and its access options.
Cite this source
Kerstin Volz. Electric Fields at Semiconductor Interfaces by momentum-resolved 4D STEM: towards Correlation with Device Characteristics. Electric Fields at Semiconductor Interfaces by momentum-resolved 4D STEM: towards Correlation with Device Characteristics. 2025. https://doi.org/10.14293/apmc13-2025-0051