3-D Temperature Measurement of Transient Plasma During Semiconductor Bridge Electroburst With High-Speed Interferometry
Yuyan Lu; Rongli Guo; Jia Wang; Dangjuan Li; Shenjiang Wu
- Published
- Publisher
- Elsevier BV
- Research area
- Semiconductors
- Source type
- Preprint / posted paper
- DOI
- 10.2139/ssrn.4809907
This is a preprint or other posted paper. Check the original source for its review and publication status.
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Cite this source
Yuyan Lu; Rongli Guo; Jia Wang; Dangjuan Li; Shenjiang Wu. 3-D Temperature Measurement of Transient Plasma During Semiconductor Bridge Electroburst With High-Speed Interferometry. Elsevier BV. 2024. https://doi.org/10.2139/ssrn.4809907