Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis
Yong Hyeon Yi; Chris Kim; Armen Kteyan; Alexander Volkov; Stephane Moreau; Valeriy Sukharev
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Energy & infrastructure
- Source type
- Conference paper
- DOI
- 10.1109/irps48228.2024.10529449
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Cite this source
Yong Hyeon Yi; Chris Kim; Armen Kteyan; Alexander Volkov; Stephane Moreau; Valeriy Sukharev. Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis. 2024 IEEE International Reliability Physics Symposium (IRPS). 2024-04-14. https://doi.org/10.1109/irps48228.2024.10529449