Leveraging Large Language Model for Automatic Patch Correctness Assessment
Xin Zhou; Bowen Xu; Kisub Kim; DongGyun Han; Hung Huu Nguyen; Thanh Le-Cong; Junda He; Bach Le; David Lo
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Software Engineering
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1109/tse.2024.3452252
The original publisher provides the full text and its access options.
Cite this source
Xin Zhou; Bowen Xu; Kisub Kim; DongGyun Han; Hung Huu Nguyen; Thanh Le-Cong; Junda He; Bach Le; David Lo. Leveraging Large Language Model for Automatic Patch Correctness Assessment. IEEE Transactions on Software Engineering. 2024-11. https://doi.org/10.1109/tse.2024.3452252