Research on double transistor open circuit fault diagnosis of T‐type three level rectifier based on mixed logical dynamical model
Jianyuan Wang; Yuxiang Liu; Dongsheng Yuan; Cong Liu; Kaiyue Zuo
- Published
- Publisher
- Institution of Engineering and Technology (IET)
- Journal / collection
- IET Electric Power Applications
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1049/elp2.12536
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Cite this source
Jianyuan Wang; Yuxiang Liu; Dongsheng Yuan; Cong Liu; Kaiyue Zuo. Research on double transistor open circuit fault diagnosis of T‐type three level rectifier based on mixed logical dynamical model. IET Electric Power Applications. 2025-01. https://doi.org/10.1049/elp2.12536