Skip to content
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Preprint / posted paper

Thickness Dependency Analysis of Igzo Based Thin Film Transistor

Akshay Verma; Nitesh Kashyap

Published
Publisher
Springer Science and Business Media LLC
Research area
Semiconductors
Source type
Preprint / posted paper
DOI
10.21203/rs.3.rs-4776056/v1

Read the original source ↗

This is a preprint or other posted paper. Check the original source for its review and publication status.

The original publisher provides the full text and its access options.

Cite this source

Akshay Verma; Nitesh Kashyap. Thickness Dependency Analysis of Igzo Based Thin Film Transistor. Springer Science and Business Media LLC. 2024-08-16. https://doi.org/10.21203/rs.3.rs-4776056/v1

Download RIS