High Temperature Characterization and Degradation Test of a Cascode Gallium Nitride Field Effect Transistor
Mohammad Dehan Rahman; Abu Shahir Md Khalid Hasan; H. Alan Mantooth; Xiaoqing Song
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/wipda62103.2024.10773107
The original publisher provides the full text and its access options.
Cite this source
Mohammad Dehan Rahman; Abu Shahir Md Khalid Hasan; H. Alan Mantooth; Xiaoqing Song. High Temperature Characterization and Degradation Test of a Cascode Gallium Nitride Field Effect Transistor. 2024 IEEE 11th Workshop on Wide Bandgap Power Devices & Applications (WiPDA). 2024-11-04. https://doi.org/10.1109/wipda62103.2024.10773107