Semiconductor Parametric Yield Prediction: A Combination of Machine Learning and Physics-Informed Approach
Karthik Sankaran; Ali Mosleh; Kamran Hakim
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 Annual Reliability and Maintainability Symposium (RAMS)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/rams48127.2025.10935067
The original publisher provides the full text and its access options.
Cite this source
Karthik Sankaran; Ali Mosleh; Kamran Hakim. Semiconductor Parametric Yield Prediction: A Combination of Machine Learning and Physics-Informed Approach. 2025 Annual Reliability and Maintainability Symposium (RAMS). 2025-01-27. https://doi.org/10.1109/rams48127.2025.10935067