Development of Time-of-flight Measurement System for Carrier Transport Characterization of TlBr Semiconductor Detectors
Yusuke Sugai; Kenichi Watanabe; Sota Hasegawa; Keitaro Hitomi; Mitsuhiro Nogami
- Published
- Publisher
- MYU K.K.
- Journal / collection
- Sensors and Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.18494/sam4631
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Cite this source
Yusuke Sugai; Kenichi Watanabe; Sota Hasegawa; Keitaro Hitomi; Mitsuhiro Nogami. Development of Time-of-flight Measurement System for Carrier Transport Characterization of TlBr Semiconductor Detectors. Sensors and Materials. 2024-01-26. https://doi.org/10.18494/sam4631