Integration of Machine Learning with Statistical Variation Analysis for Ferroelectric Transistor (FE-MOSFETs)
Abhay Pratap Singh; R. K. Baghel; Sukeshni Tirkey
- Published
- Publisher
- World Scientific Pub Co Pte Ltd
- Journal / collection
- Materials Open
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1142/s2811086224400016
The original publisher provides the full text and its access options.
Cite this source
Abhay Pratap Singh; R. K. Baghel; Sukeshni Tirkey. Integration of Machine Learning with Statistical Variation Analysis for Ferroelectric Transistor (FE-MOSFETs). Materials Open. 2024-01. https://doi.org/10.1142/s2811086224400016