Yield Analysis and Fault Isolation With Artificial Intelligence (AI) in Semiconductor Industry
Supriyo Karmakar; Sayantani Karmakar
- Published
- Publisher
- IEEE
- Journal / collection
- SoutheastCon 2025
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/southeastcon56624.2025.10971710
The original publisher provides the full text and its access options.
Cite this source
Supriyo Karmakar; Sayantani Karmakar. Yield Analysis and Fault Isolation With Artificial Intelligence (AI) in Semiconductor Industry. SoutheastCon 2025. 2025-03-22. https://doi.org/10.1109/southeastcon56624.2025.10971710