Role of semiconductor layer thickness in the electrical properties of BaTiO3-based MFIS-heterostructured devices
Akshay Panchasara; Urjitsinh Rathod; Sumana Hajra; Akshay Ranpariya; Savan Katba; Mahesh Jivani; Ashish Ravalia
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Materials Science: Materials in Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10854-024-13208-w
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Cite this source
Akshay Panchasara; Urjitsinh Rathod; Sumana Hajra; Akshay Ranpariya; Savan Katba; Mahesh Jivani; Ashish Ravalia. Role of semiconductor layer thickness in the electrical properties of BaTiO3-based MFIS-heterostructured devices. Journal of Materials Science: Materials in Electronics. 2024-07. https://doi.org/10.1007/s10854-024-13208-w