Characterization of HBT-based Avalanche Noise Sources Using Standard Test Structures for Measurement of Transistor Scattering Parameters
Ethan Bernardini; Giacomo Schiavolini; Giulia Orecchini; Gunter Fischer; Corrado Carta; Federico Alimenti
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/sirf63957.2025.11076623
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Cite this source
Ethan Bernardini; Giacomo Schiavolini; Giulia Orecchini; Gunter Fischer; Corrado Carta; Federico Alimenti. Characterization of HBT-based Avalanche Noise Sources Using Standard Test Structures for Measurement of Transistor Scattering Parameters. 2025 IEEE 24th Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems (SiRF). 2025-01-19. https://doi.org/10.1109/sirf63957.2025.11076623