Soldering Defect Identification Using Deep Learning and Machine Learning Approach
Swati Shilaskar; Sai Singar; Abhijit Sonawane; Shobit Shinde
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 First International Conference on Electronics, Communication and Signal Processing (ICECSP)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/icecsp61809.2024.10698480
The original publisher provides the full text and its access options.
Cite this source
Swati Shilaskar; Sai Singar; Abhijit Sonawane; Shobit Shinde. Soldering Defect Identification Using Deep Learning and Machine Learning Approach. 2024 First International Conference on Electronics, Communication and Signal Processing (ICECSP). 2024-08-08. https://doi.org/10.1109/icecsp61809.2024.10698480