Simple RF on-chip calibration for high-frequency transistor measurements
M. Florovič; M. Dzuriš; R. HarťAnský; J. Kovac; A. Chvála; D. Gregušová; F. Gucmann; M. Ťapajna
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 15th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/asdam63148.2024.10844608
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Cite this source
M. Florovič; M. Dzuriš; R. HarťAnský; J. Kovac; A. Chvála; D. Gregušová; F. Gucmann; M. Ťapajna. Simple RF on-chip calibration for high-frequency transistor measurements. 2024 15th International Conference on Advanced Semiconductor Devices and Microsystems (ASDAM). 2024-10-20. https://doi.org/10.1109/asdam63148.2024.10844608