Temperature Measurement of a Nanowire SOI Transistor Using a Parallel Gated SOI PIN Diode
Felipe Rodrigues Gare Carnielli; Marcelo Antonio Pavanello
- Published
- Publisher
- Journal of Integrated Circuits and Systems
- Journal / collection
- Journal of Integrated Circuits and Systems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.29292/jics.v19i2.818
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Cite this source
Felipe Rodrigues Gare Carnielli; Marcelo Antonio Pavanello. Temperature Measurement of a Nanowire SOI Transistor Using a Parallel Gated SOI PIN Diode. Journal of Integrated Circuits and Systems. 2024-08-01. https://doi.org/10.29292/jics.v19i2.818