Enhanced Semiconductor Wafer Defect Classification with CNN and SVM
Vishal Yadav; Deepak Banerjee; Deepak Upadhyay; Vijay Singh
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 Asia Pacific Conference on Innovation in Technology (APCIT)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/apcit62007.2024.10673497
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Cite this source
Vishal Yadav; Deepak Banerjee; Deepak Upadhyay; Vijay Singh. Enhanced Semiconductor Wafer Defect Classification with CNN and SVM. 2024 Asia Pacific Conference on Innovation in Technology (APCIT). 2024-07-26. https://doi.org/10.1109/apcit62007.2024.10673497