Current induced electromechanical strain in thin antipolar Ag2Se semiconductor
Hao Luo; Qi Liang; Anan Guo; Yimeng Yu; Haoyang Peng; Xiaoyi Gao; Yihao Hu; Xianli Su; Ctirad Uher; Yu Zheng; Dongwang Yang; Xiaolin Wang; Qingjie Zhang; Xinfeng Tang; Shi Liu; Gustaaf Van Tendeloo; Shujun Zhang; Jinsong Wu
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Nature Communications
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41467-025-57057-5
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Hao Luo; Qi Liang; Anan Guo; Yimeng Yu; Haoyang Peng; Xiaoyi Gao; Yihao Hu; Xianli Su; Ctirad Uher; Yu Zheng; Dongwang Yang; Xiaolin Wang; Qingjie Zhang; Xinfeng Tang; Shi Liu; Gustaaf Van Tendeloo; Shujun Zhang; Jinsong Wu. Current induced electromechanical strain in thin antipolar Ag2Se semiconductor. Nature Communications. 2025-02-20. https://doi.org/10.1038/s41467-025-57057-5