An Online Converter-Level Wear-Out Failure Mode Separation Method for Power Semiconductor Devices
Yingzhou Peng; Kaichun Wang; Xing Wei; Zhikang Shuai; Huai Wang
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Industrial Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tie.2024.3454465
The original publisher provides the full text and its access options.
Cite this source
Yingzhou Peng; Kaichun Wang; Xing Wei; Zhikang Shuai; Huai Wang. An Online Converter-Level Wear-Out Failure Mode Separation Method for Power Semiconductor Devices. IEEE Transactions on Industrial Electronics. 2025-04. https://doi.org/10.1109/tie.2024.3454465