Enhanced Test Socket Reliability: Multi-Modal Failure Analysis and Design Optimization for High-Volume Semiconductor Manufacturing
Ella Schwirzke; Rachael Gitnes; Christopher Maciel
- Published
- Publisher
- ASM International
- Journal / collection
- International Symposium for Testing and Failure Analysis
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.31399/asm.cp.istfa2026p0229
The original publisher provides the full text and its access options.
Cite this source
Ella Schwirzke; Rachael Gitnes; Christopher Maciel. Enhanced Test Socket Reliability: Multi-Modal Failure Analysis and Design Optimization for High-Volume Semiconductor Manufacturing. International Symposium for Testing and Failure Analysis. 2026-10-04. https://doi.org/10.31399/asm.cp.istfa2026p0229