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Research literature / Conference paper

Hot-Carrier-Induced Degradations and Optimizations for Lateral DMOS Transistor with Shallow Trench Isolation and Step Oxide Improvement

Zhibo Liuo; Tian Chen; Kui Li; Bo Kan; Li Xiao; Li Wang; Hualun Chen

Published
Publisher
IEEE
Journal / collection
2024 Conference of Science and Technology for Integrated Circuits (CSTIC)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/cstic61820.2024.10532101

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Zhibo Liuo; Tian Chen; Kui Li; Bo Kan; Li Xiao; Li Wang; Hualun Chen. Hot-Carrier-Induced Degradations and Optimizations for Lateral DMOS Transistor with Shallow Trench Isolation and Step Oxide Improvement. 2024 Conference of Science and Technology for Integrated Circuits (CSTIC). 2024-03-17. https://doi.org/10.1109/cstic61820.2024.10532101

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