Differential Hall Effect Metrology for Electrical Characterization of Advanced Semiconductor Layers
Bulent M. Basol; Abhijeet Joshi
- Published
- Publisher
- MDPI AG
- Journal / collection
- Metrology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/metrology4040034
The original publisher provides the full text and its access options.
Cite this source
Bulent M. Basol; Abhijeet Joshi. Differential Hall Effect Metrology for Electrical Characterization of Advanced Semiconductor Layers. Metrology. 2024-10-02. https://doi.org/10.3390/metrology4040034