Quantile-based Long Short Term Memory Remaining Useful Life prediction of Metal-Oxide-Semiconductor Field-Effect Transistor
Yonatan Saadon; Noam Auslander; F. Patrick McCluskey
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 23rd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/itherm55375.2024.10709525
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Cite this source
Yonatan Saadon; Noam Auslander; F. Patrick McCluskey. Quantile-based Long Short Term Memory Remaining Useful Life prediction of Metal-Oxide-Semiconductor Field-Effect Transistor. 2024 23rd IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm). 2024-05-28. https://doi.org/10.1109/itherm55375.2024.10709525