Spot pattern recognition and optimization of semiconductor lasers based on computer vision and deep learning
Yuting Ge
- Published
- Publisher
- SPIE
- Journal / collection
- Second International Conference on Electronics, Electrical, and Control System (EECS 2025)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1117/12.3071026
The original publisher provides the full text and its access options.
Cite this source
Yuting Ge. Spot pattern recognition and optimization of semiconductor lasers based on computer vision and deep learning. Second International Conference on Electronics, Electrical, and Control System (EECS 2025). 2025-06-25. https://doi.org/10.1117/12.3071026