Electric Field Modulation in Gate-All-Around Nanosheet Transistor
Arvind Bisht; Yogendra Pratap Pundir; Tushar Goel; Pankaj Kumar Pal
- Published
- Publisher
- IEEE
- Journal / collection
- 2024 International Conference on Computer, Electronics, Electrical Engineering & their Applications (IC2E3)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ic2e362166.2024.10826680
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Cite this source
Arvind Bisht; Yogendra Pratap Pundir; Tushar Goel; Pankaj Kumar Pal. Electric Field Modulation in Gate-All-Around Nanosheet Transistor. 2024 International Conference on Computer, Electronics, Electrical Engineering & their Applications (IC2E3). 2024-06-06. https://doi.org/10.1109/ic2e362166.2024.10826680