Conference paper · Semiconductors
International Symposium for Testing and Failure Analysis · 4 October 2026
Michael Beetz; Clemens Grünewald; Thomas Gänsler et al.
Journal article · AI & compute
Discover Internet of Things · 4 October 2026
Kathiresan Jayabalan; P. Sreelatha; T. Dakshinamurthy et al.
Conference paper · Semiconductors
International Symposium for Testing and Failure Analysis · 4 October 2026
Ajinkya Kadu; Maadhav Kothari; Mritunjay Prasad et al.
Journal article · AI & compute
Actual problems of innovative economy and law · 4 October 2026
Oksana Nesterenko
Conference paper · Semiconductors
International Symposium for Testing and Failure Analysis · 4 October 2026
Noriyuki Inoue; Shinobu Uno; Yasuyuki Okano et al.
Conference paper · Semiconductors
International Symposium for Testing and Failure Analysis · 4 October 2026
Till Dreier; Daniel Nilsson; Julius Hållstedt
Journal article · Energy & infrastructure
Advanced Control for Applications · 4 October 2026
Samir M. Dawoud
Conference paper · Semiconductors
International Symposium for Testing and Failure Analysis · 4 October 2026
Peter Gnauck; Alexander Ost; Torsten Richter
Journal article · Capital & markets
JOURNAL OF SOCIAL RESEARCH DEVELOPMENT · 4 October 2026
Alisha Maqsood; Muhammad Nazam; Mirza Nasir Jahan Mehdi
Conference paper · Semiconductors
International Symposium for Testing and Failure Analysis · 4 October 2026
Samuel Mondberg; Luis D. Bonavena; Teresa K. Pfau et al.
Conference paper · Semiconductors
International Symposium for Testing and Failure Analysis · 4 October 2026
William A. Hubbard
Journal article · AI & compute
Skeletal Radiology · 4 October 2026
Peyman Mirghaderi; Nasim Eshraghi; Hyun Su Kim et al.